Studente AZMAN, SITI NUR AFIFA BINTI
Facoltà/Dipartimento Dipartimento Ingegneria dell'Informazione
Corso di studio BIOMEDICAL ENGINEERING
Anno Accademico 2019
Data dell'esame finale 2020-10-27
Titolo italiano Near-Field Inverted Scanning Microwave Microscopy
Titolo inglese Near-Field Inverted Scanning Microwave Microscopy
Abstract in italiano Near-field Scanning Microwave Microscopy (NSMM) is a technique that produces an image from the evanescent microwave field interacting with the sample with the spatial resolution down to the atomic scale. This technique is commonly used simultaneously with any scanning probe microscopy (SPM) technique, such as the atomic force microscopy (AFM) or the scanning tunneling microscopy (STM). The NSMM is prominent for providing non-invasive imaging of sub-surface structures and allowing local quantitative characterization of the sample. Regardless, a novel technique known as near-field Inverted Scanning Microwave Microscopy (iSMM) is the improvement developed recently to broaden the application beyond the current focus on surface physics and semiconductor technology. Despite the iSMM offer advantages over NSMM, this technique has not been widely commercialized and the system setup needs to be custom designed according to the existing instruments we have in our microscopy laboratory. In the present work, the iSMM setup was constructed with a slight modification of SPM probe into a simple and rugged metal tip, and utilization of a transmission line as part of the sample holder. The setup was then evaluated by performing the sensitivity test, waveguide analysis and verified by scanning on real sample. The microwave image (S11) of graphite at frequency 12.03 GHz acquired by the AFM-modified iSMM. After applying proper calibration procedure and the time domain analysis, the quality of the iSMM image is improved and the details of graphite flake is well visible. The AFM-modified iSMM has been successfully developed for real sample analysis at high frequencies.
Abstract in inglese Near-field Scanning Microwave Microscopy (NSMM) is a technique that produces an image from the evanescent microwave field interacting with the sample with the spatial resolution down to the atomic scale. This technique is commonly used simultaneously with any scanning probe microscopy (SPM) technique, such as the atomic force microscopy (AFM) or the scanning tunneling microscopy (STM). The NSMM is prominent for providing non-invasive imaging of sub-surface structures and allowing local quantitative characterization of the sample. Regardless, a novel technique known as near-field Inverted Scanning Microwave Microscopy (iSMM) is the improvement developed recently to broaden the application beyond the current focus on surface physics and semiconductor technology. Despite the iSMM offer advantages over NSMM, this technique has not been widely commercialized and the system setup needs to be custom designed according to the existing instruments we have in our microscopy laboratory. In the present work, the iSMM setup was constructed with a slight modification of SPM probe into a simple and rugged metal tip, and utilization of a transmission line as part of the sample holder. The setup was then evaluated by performing the sensitivity test, waveguide analysis and verified by scanning on real sample. The microwave image (S11) of graphite at frequency 12.03 GHz acquired by the AFM-modified iSMM. After applying proper calibration procedure and the time domain analysis, the quality of the iSMM image is improved and the details of graphite flake is well visible. The AFM-modified iSMM has been successfully developed for real sample analysis at high frequencies.
Relatore FARINA, MARCO
Controrelatore PAVONI, ELEONORA
Appare nelle tipologie: Laurea specialistica, magistrale, ciclo unico
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Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/20.500.12075/3457